TY  - RPRT
TI  - Characterizing transition-metal dichalcogenide thin-films using hyperspectral imaging and machine learning
AU  - Shevitski, Brian
AU  - Chen, Christopher T.
AU  - Kastl, Christoph
AU  - Kuykendall, Tevye
AU  - Schwartzberg, Adam
AU  - Aloni, Shaul
AU  - Zettl, Alex
PY  - 2020
DO  - 10.1038/s41598-020-68321-7
UR  - https://www.osti.gov/biblio/1638397
ID  - 1638397
ER  -