TY  - RPRT
TI  - Complexion dictated thermal resistance with interface density in reactive metal multilayers
AU  - Saltonstall, Christopher B.
AU  - McClure, Zachary D.
AU  - Abere, Michael J.
AU  - Guzman, David
AU  - Reeve, Samuel Temple
AU  - Strachan, Alejandro
AU  - Kotula, Paul G.
AU  - Adams, David P.
AU  - Beechem, Thomas E.
PY  - 2020
DO  - 10.1103/physrevb.101.245422
UR  - https://www.osti.gov/biblio/1639057
ID  - 1639057
ER  -