@misc{indiciae26e0f001cb69,
  title = {Radiative capture rates at deep defects from electronic structure calculations},
  author = {Dreyer, Cyrus E. and Alkauskas, Audrius and Lyons, John L. (ORCID:0000000180233055) and Van de Walle, Chris G.},
  year = {2020},
  doi = {10.1103/physrevb.102.085305},
  url = {https://www.osti.gov/biblio/1652423},
  note = {Source identifier: 1652423}
}