TY  - RPRT
TI  - Radiative capture rates at deep defects from electronic structure calculations
AU  - Dreyer, Cyrus E.
AU  - Alkauskas, Audrius
AU  - Lyons, John L. (ORCID:0000000180233055)
AU  - Van de Walle, Chris G.
PY  - 2020
DO  - 10.1103/physrevb.102.085305
UR  - https://www.osti.gov/biblio/1652423
ID  - 1652423
ER  -