TY  - RPRT
TI  - Gradient microstructure induced shear band constraint, delocalization, and delayed failure in CuZr nanoglasses
AU  - Yuan, Suyue
AU  - Branicio, Paulo S.
PY  - 2020
DO  - 10.1016/j.ijplas.2020.102845
UR  - https://www.osti.gov/biblio/1656909
ID  - 1656909
ER  -