@misc{indiciae772338361b0a,
  title = {Quantitative Specifications to Avoid Degradation during E-Beam and Induced Current Microscopy of Halide Perovskite Devices},
  author = {Luo, Yanqi and Parikh, Pritesh and Brenner, Thomas M. and Kim, Min-cheol and Wang, Rui and Yang, Yang and Correa-Baena, Juan-Pablo and Buonassisi, Tonio and Meng, Ying Shirley and Fenning, David P.},
  year = {2020},
  doi = {10.1021/acs.jpcc.0c06733},
  url = {https://www.osti.gov/biblio/1659669},
  note = {Source identifier: 1659669}
}