@misc{indiciae32a994133efd,
  title = {Failure analysis of field-failed bypass diodes},
  author = {Xiao, Chuanxiao and Hacke, Peter and Johnston, Steven and Kern, Dana and Jiang, Chun Sheng and Al-Jassim, Mowafak},
  year = {2020},
  doi = {10.1002/pip.3297},
  url = {https://www.osti.gov/biblio/1660048},
  note = {Source identifier: 1660048}
}