@misc{indiciae386f7490250f,
  title = {High-Energy X-Ray Diffraction Microscopy in Materials Science},
  author = {Bernier, Joel V. and Suter, Robert M. and Rollett, Anthony D. and Almer, Jonathan D.},
  year = {2020},
  doi = {10.1146/annurev-matsci-070616-124125},
  url = {https://www.osti.gov/biblio/1662034},
  note = {Source identifier: 1662034}
}