@misc{indiciae5abf400e0112,
  title = {Defect localization characterization and reliability model development for microsystems-enabled photovoltaics.},
  author = {Cruz-Campa, Jose Luis and Haase, Gad S. and Tangyunyong, Paiboon and Okandan, Murat and Nielson, Gregory N. and Yang, Benjamin Bing-Yeh},
  year = {2013},
  url = {https://www.osti.gov/biblio/1662107},
  note = {Source identifier: 1662107}
}