TY  - RPRT
TI  - Layer-Dependent Bit Error Variation in 3-D NAND Flash Under Ionizing Radiation
AU  - Kumari, Preeti
AU  - Huang, Sijay
AU  - Wasiolek, Maryla
AU  - Hattar, Khalid
AU  - Ray, Biswajit
PY  - 2020
DO  - 10.1109/tns.2020.3014261
UR  - https://www.osti.gov/biblio/1667396
ID  - 1667396
ER  -