@misc{indiciaebdfb499e63e5,
  title = {Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering},
  author = {Levine, A and Bu, G. and Biswas, S. and Tsai, E. and Braunschweig, A. and Nannenga, B.},
  year = {2022},
  doi = {10.1039/d0cc00119h},
  url = {https://www.osti.gov/biblio/1690034},
  note = {Source identifier: 1690034}
}