TY  - RPRT
TI  - Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering
AU  - Levine, A
AU  - Bu, G.
AU  - Biswas, S.
AU  - Tsai, E.
AU  - Braunschweig, A.
AU  - Nannenga, B.
PY  - 2022
DO  - 10.1039/d0cc00119h
UR  - https://www.osti.gov/biblio/1690034
ID  - 1690034
ER  -