@misc{indiciae41a9450d1a3a,
  title = {Soft sample deformation, damage and induced electromechanical property changes in contact- and tapping-mode atomic force microscopy},
  author = {Saadi, M. R. and Uluutku, Berkin and Parvini, Cameron H. and Solares, Santiago D.},
  year = {2020},
  doi = {10.1088/2051-672x/abb888},
  url = {https://www.osti.gov/biblio/1696774},
  note = {Source identifier: 1696774}
}