TY  - RPRT
TI  - Soft sample deformation, damage and induced electromechanical property changes in contact- and tapping-mode atomic force microscopy
AU  - Saadi, M. R.
AU  - Uluutku, Berkin
AU  - Parvini, Cameron H.
AU  - Solares, Santiago D.
PY  - 2020
DO  - 10.1088/2051-672x/abb888
UR  - https://www.osti.gov/biblio/1696774
ID  - 1696774
ER  -