TY  - RPRT
TI  - Sulfurization as a promising surface passivation approach for both n- and p-type Si
AU  - Das, Ujjwal
AU  - Theisen, Robert
AU  - Hanket, Greg
AU  - Upadhyaya, Ajay
AU  - Rohatgi, Ajeet
AU  - Hua, Amandee
AU  - Weinhardt, Lothar
AU  - Hauschild, Dirk
AU  - Heske, Clemens
PY  - 2020
DO  - 10.1109/pvsc45281.2020.9300395
UR  - https://www.osti.gov/biblio/1706719
ID  - 1706719
ER  -