TY  - RPRT
TI  - High Layer Uniformity of Two-Dimensional Materials Demonstrated Surprisingly from Broad Features in Surface Electron Diffraction
AU  - Chen, S.
AU  - Horn von Hoegen, M.
AU  - Thiel, P. A.
AU  - Kaminski, A.
AU  - Schrunk, B.
AU  - Speliotis, T.
AU  - Conrad, E. H.
AU  - Tringides, M. C.
PY  - 2020
DO  - 10.1021/acs.jpclett.0c02113
UR  - https://www.osti.gov/biblio/1709117
ID  - 1709117
ER  -