@misc{indiciae8152dd8a2af7,
  title = {A quantitative structural characterisation of active semiconducting materials (mSi; SiO[subscript 2]; Al[subscript 2]O[subscript 3]; TiO[subscript 2]) for use in printed electronics using a combination of Small Angle Light Scattering (SALS) and Ultra Small Angle X-ray Scattering (USAXS)},
  author = {Setshedi, Rhyme and Zambou, Serges and Jonah, Emmanuel O. and Magunje, Batsirai and Unuigbe, David M. and Britton, David T. and Harting, Margit and Sone, Michael Ekonde},
  year = {2020},
  doi = {10.1088/1361-6528/abac7b},
  url = {https://www.osti.gov/biblio/1712486},
  note = {Source identifier: 1712486}
}