TY  - RPRT
TI  - A quantitative structural characterisation of active semiconducting materials (mSi; SiO[subscript 2]; Al[subscript 2]O[subscript 3]; TiO[subscript 2]) for use in printed electronics using a combination of Small Angle Light Scattering (SALS) and Ultra Small Angle X-ray Scattering (USAXS)
AU  - Setshedi, Rhyme
AU  - Zambou, Serges
AU  - Jonah, Emmanuel O.
AU  - Magunje, Batsirai
AU  - Unuigbe, David M.
AU  - Britton, David T.
AU  - Harting, Margit
AU  - Sone, Michael Ekonde
PY  - 2020
DO  - 10.1088/1361-6528/abac7b
UR  - https://www.osti.gov/biblio/1712486
ID  - 1712486
ER  -