TY  - RPRT
TI  - Investigation of Dynamic Temperature-Sensitive Electrical Parameters for Medium-Voltage Low-Current Silicon Carbide and Silicon Devices
AU  - Ni, Ze
AU  - Zheng, Sheng
AU  - Chinthavali, Madhu Sudhan
AU  - Cao, Dong
PY  - 2020
DO  - 10.1109/ecce44975.2020.9236121
UR  - https://www.osti.gov/biblio/1760095
ID  - 1760095
ER  -