@misc{indiciae3efc9fd6be77,
  title = {Interrogating atomic- and nanoscaled defects of structural metals using advanced microscopy techniques.},
  author = {Sabisch, Julian Elmar Correa},
  year = {2020},
  url = {https://www.osti.gov/biblio/1761580},
  note = {Source identifier: 1761580}
}