TY  - RPRT
TI  - Quantifying leakage fields at ionic grain boundaries using off-axis electron holography
AU  - Xu, Xin
AU  - Barrows, Frank
AU  - Dravid, Vinayak P.
AU  - Haile, Sossina M.
AU  - Phatak, Charudatta
PY  - 2020
DO  - 10.1063/5.0031233
UR  - https://www.osti.gov/biblio/1762410
ID  - 1762410
ER  -