@misc{indiciae143709d91c38,
  title = {Submicron Thickness Characterization of Poly-Si Thin Films on Textured Surfaces by X-Ray Diffraction for Minimizing Parasitic Absorption in Poly-Si/SiO2 Passivating Contact Cells},
  author = {Chen, Kejun and LaSalvia, Vincenzo and Nemeth, William and Theingi, San and Guthrey, Harvey (ORCID:0000000315743379) and Hartenstein, Matthew B. and Kale, Abhijit S. and Page, Matthew and Bothwell, Alex and Sites, James and Stradins, Paul and Agarwal, Sumit and Young, David L.},
  year = {2021},
  doi = {10.1109/pvsc45281.2020.9300794},
  url = {https://www.osti.gov/biblio/1765610},
  note = {Source identifier: 1765610}
}