TY  - RPRT
TI  - Submicron Thickness Characterization of Poly-Si Thin Films on Textured Surfaces by X-Ray Diffraction for Minimizing Parasitic Absorption in Poly-Si/SiO2 Passivating Contact Cells
AU  - Chen, Kejun
AU  - LaSalvia, Vincenzo
AU  - Nemeth, William
AU  - Theingi, San
AU  - Guthrey, Harvey (ORCID:0000000315743379)
AU  - Hartenstein, Matthew B.
AU  - Kale, Abhijit S.
AU  - Page, Matthew
AU  - Bothwell, Alex
AU  - Sites, James
AU  - Stradins, Paul
AU  - Agarwal, Sumit
AU  - Young, David L.
PY  - 2021
DO  - 10.1109/pvsc45281.2020.9300794
UR  - https://www.osti.gov/biblio/1765610
ID  - 1765610
ER  -