@misc{indiciae78414148a3a9,
  title = {Understanding Electrothermal Instability Growth by Comparing Z-Pinches with Engineered Defects to 3D-MHD Simulations.},
  author = {Awe, Thomas James and Yu, E. P. and Hutchinson, T. M. and Bauer, B. S. and Hatch, M. W. and Shipley, G. A. and Hutsel, B. T.},
  year = {2020},
  url = {https://www.osti.gov/biblio/1768350},
  note = {Source identifier: 1768350}
}