TY  - RPRT
TI  - Understanding Electrothermal Instability Growth by Comparing Z-Pinches with Engineered Defects to 3D-MHD Simulations.
AU  - Awe, Thomas James
AU  - Yu, E. P.
AU  - Hutchinson, T. M.
AU  - Bauer, B. S.
AU  - Hatch, M. W.
AU  - Shipley, G. A.
AU  - Hutsel, B. T.
PY  - 2020
UR  - https://www.osti.gov/biblio/1768350
ID  - 1768350
ER  -