@misc{indiciae787dd0e826f3,
  title = {Directly measuring the structural transition pathways of strain-engineered VO 2 thin films},
  author = {Evlyukhin, Egor and Howard, Sebastian A. and Paik, Hanjong and Paez, Galo J. and Gosztola, David J. and Singh, Christopher N. and Schlom, Darrell G. and Lee, Wei-Cheng and Piper, Louis J.},
  year = {2020},
  doi = {10.1039/d0nr04776g},
  url = {https://www.osti.gov/biblio/1771313},
  note = {Source identifier: 1771313}
}