TY  - RPRT
TI  - Directly measuring the structural transition pathways of strain-engineered VO 2 thin films
AU  - Evlyukhin, Egor
AU  - Howard, Sebastian A.
AU  - Paik, Hanjong
AU  - Paez, Galo J.
AU  - Gosztola, David J.
AU  - Singh, Christopher N.
AU  - Schlom, Darrell G.
AU  - Lee, Wei-Cheng
AU  - Piper, Louis J.
PY  - 2020
DO  - 10.1039/d0nr04776g
UR  - https://www.osti.gov/biblio/1771313
ID  - 1771313
ER  -