@misc{indiciae46d82f94e966,
  title = {Total Ionizing Dose Effect Study on Radiation-Hard Power MOSFET Device.},
  author = {Kerber, Pranita and Leeson, Kenneth Michael and Gao, Xujiao and Musson, Lawrence and Campbell, Philip and McLain, Michael Lee and Paskaleva, Biliana Stefanova and Mar, Alan},
  year = {2020},
  url = {https://www.osti.gov/biblio/1772208},
  note = {Source identifier: 1772208}
}