TY  - RPRT
TI  - Damage initiation and evolution in Al-Si layered microstructures under shock loading conditions at atomic scales
AU  - Echeverria, Marco J.
AU  - Suresh, Sumit
AU  - Dongare, Avinash
PY  - 2020
DO  - 10.1063/12.0000979
UR  - https://www.osti.gov/biblio/1772476
ID  - 1772476
ER  -