@misc{indiciae83a27c6a3de5,
  title = {Strain mapping at nanometer resolution using advanced nano-beam electron diffraction},
  author = {Ozdol, V. B. and Gammer, C. and Jin, X. G. and Ercius, P. and Ophus, C. and Ciston, J. and Minor, A. M.},
  year = {2015},
  doi = {10.1063/1.4922994},
  url = {https://www.osti.gov/biblio/1773706},
  note = {Source identifier: 1773706}
}