TY  - RPRT
TI  - Strain mapping at nanometer resolution using advanced nano-beam electron diffraction
AU  - Ozdol, V. B.
AU  - Gammer, C.
AU  - Jin, X. G.
AU  - Ercius, P.
AU  - Ophus, C.
AU  - Ciston, J.
AU  - Minor, A. M.
PY  - 2015
DO  - 10.1063/1.4922994
UR  - https://www.osti.gov/biblio/1773706
ID  - 1773706
ER  -