TY  - RPRT
TI  - High resolution structural refinement and band gap characterization of the defect chalcopyrites CuIn5Te8, AgIn5Te8 and AuIn5Te8
AU  - Ni, Danrui
AU  - Nguyen, Loi T.
AU  - Feverston, Elizabeth Seibel
AU  - Zhong, Ruidan
AU  - Cava, Robert J.
PY  - 2020
DO  - 10.1016/j.jssc.2020.121752
UR  - https://www.osti.gov/biblio/1776101
ID  - 1776101
ER  -