@misc{indiciaef21aac2fc9bd,
  title = {Advanced CMOS Reliability Update: Sub 20nm FinFET Assessment},
  author = {Walraven, Jeremy A. and King, Michael Douglas and Kaplar, Robert and Haase, Gad S. and Grzybowski, Thomas Anthony},
  year = {2020},
  doi = {10.2172/1779710},
  url = {https://www.osti.gov/biblio/1779710},
  note = {Source identifier: 1779710}
}