TY  - RPRT
TI  - Advanced CMOS Reliability Update: Sub 20nm FinFET Assessment
AU  - Walraven, Jeremy A.
AU  - King, Michael Douglas
AU  - Kaplar, Robert
AU  - Haase, Gad S.
AU  - Grzybowski, Thomas Anthony
PY  - 2020
DO  - 10.2172/1779710
UR  - https://www.osti.gov/biblio/1779710
ID  - 1779710
ER  -