TY  - RPRT
TI  - Properties of interfaces between copper and copper sulphide/oxide films
AU  - Halldin Stenlid, Joakim
AU  - Campos dos Santos, Egon
AU  - Johansson, Adam Johannes
AU  - Pettersson, Lars G.M.
PY  - 2021
DO  - 10.1016/j.corsci.2021.109313
UR  - https://www.osti.gov/biblio/1780977
ID  - 1780977
ER  -