@misc{indiciaeb8fb7f5194d7,
  title = {Machine learning for neutron reflectometry data analysis of two-layer thin films},
  author = {Doucet, Mathieu and Archibald, Richard K. and Heller, William T.},
  year = {2021},
  doi = {10.1088/2632-2153/abf257},
  url = {https://www.osti.gov/biblio/1782065},
  note = {Source identifier: 1782065}
}