TY  - RPRT
TI  - Machine learning for neutron reflectometry data analysis of two-layer thin films
AU  - Doucet, Mathieu
AU  - Archibald, Richard K.
AU  - Heller, William T.
PY  - 2021
DO  - 10.1088/2632-2153/abf257
UR  - https://www.osti.gov/biblio/1782065
ID  - 1782065
ER  -