TY  - RPRT
TI  - Structural Tolerance Factor Approach to Defect-Resistant I 2 -II-IV-X 4 Semiconductor Design
AU  - Sun, Jon-Paul
AU  - McKeown Wessler, Garrett C.
AU  - Wang, Tianlin
AU  - Zhu, Tong
AU  - Blum, Volker
AU  - Mitzi, David B.
PY  - 2020
DO  - 10.1021/acs.chemmater.9b05107
UR  - https://www.osti.gov/biblio/1783206
ID  - 1783206
ER  -