@misc{indiciae9dcecc2a9801,
  title = {Decoding defect statistics from diffractograms via machine learning},
  author = {Kunka, Cody (ORCID:0000000315855055) and Shanker, Apaar and Chen, Elton Y. and Kalidindi, Surya R. (ORCID:0000000169097507) and Dingreville, Rémi (ORCID:000000031613695X)},
  year = {2021},
  doi = {10.1038/s41524-021-00539-z},
  url = {https://www.osti.gov/biblio/1783319},
  note = {Source identifier: 1783319}
}