@misc{indiciaec0f89da37024,
  title = {Identification of localized radiation damage in power MOSFETs using EBIC imaging},
  author = {Ashby, David Scott and Garland, Diana and Esposito, Madeline G. and Vizkelethy, Gyorgy and Marinella, Matthew J. and McLain, Michael Lee and Llinás, J. P. and Talin, Albert Alec},
  year = {2021},
  doi = {10.1063/5.0053892},
  url = {https://www.osti.gov/biblio/1787526},
  note = {Source identifier: 1787526}
}