@misc{indiciae610a6f37ea22,
  title = {The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision},
  author = {Padgett, Elliot and Holtz, Megan E. and Cueva, Paul and Shao, Yu-Tsun and Langenberg, Eric and Schlom, Darrell G. and Muller, David A.},
  year = {2020},
  doi = {10.1016/j.ultramic.2020.112994},
  url = {https://www.osti.gov/biblio/1799288},
  note = {Source identifier: 1799288}
}