TY  - RPRT
TI  - The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision
AU  - Padgett, Elliot
AU  - Holtz, Megan E.
AU  - Cueva, Paul
AU  - Shao, Yu-Tsun
AU  - Langenberg, Eric
AU  - Schlom, Darrell G.
AU  - Muller, David A.
PY  - 2020
DO  - 10.1016/j.ultramic.2020.112994
UR  - https://www.osti.gov/biblio/1799288
ID  - 1799288
ER  -