@misc{indiciae3de6f45cc67c,
  title = {Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction},
  author = {Addiego, Christopher and Gao, Wenpei and Pan, Xiaoqing},
  year = {2020},
  doi = {10.1016/j.ultramic.2019.112850},
  url = {https://www.osti.gov/biblio/1802660},
  note = {Source identifier: 1802660}
}