TY  - RPRT
TI  - Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction
AU  - Addiego, Christopher
AU  - Gao, Wenpei
AU  - Pan, Xiaoqing
PY  - 2020
DO  - 10.1016/j.ultramic.2019.112850
UR  - https://www.osti.gov/biblio/1802660
ID  - 1802660
ER  -