TY  - RPRT
TI  - Correlation of Early-Stage Growth Process Conditions with Dislocation Evolution in MOCVD-Based GaP/Si Heteroepitaxy
AU  - Boyer, J. T.
AU  - Blumer, A. N.
AU  - Blumer, Z. H.
AU  - Lepkowski, D. L.
AU  - Grassman, T. J.
PY  - 2021
DO  - 10.1016/j.jcrysgro.2021.126251
UR  - https://www.osti.gov/biblio/1807801
ID  - 1807801
ER  -