@misc{indiciaea220e8e872d5,
  title = {Picometer-Precision Atomic Position Tracking through Electron Microscopy},
  author = {Miao, Leixin and Chmielewski, Adrian and Mukherjee, Debangshu and Alem, Nasim},
  year = {2021},
  doi = {10.3791/62164},
  url = {https://www.osti.gov/biblio/1808385},
  note = {Source identifier: 1808385}
}