TY  - RPRT
TI  - Picometer-Precision Atomic Position Tracking through Electron Microscopy
AU  - Miao, Leixin
AU  - Chmielewski, Adrian
AU  - Mukherjee, Debangshu
AU  - Alem, Nasim
PY  - 2021
DO  - 10.3791/62164
UR  - https://www.osti.gov/biblio/1808385
ID  - 1808385
ER  -