@misc{indiciaeb145c0d15588,
  title = {Encapsulant Void Breakdown Voltage Modeling \& Experiments},
  author = {Moore, Christopher H. and Clem, Paul G. and Biedermann, Laura B. and Miller, William K. and Stavig, Mark E. and Turner, Christian D.},
  year = {2020},
  doi = {10.2172/1808742},
  url = {https://www.osti.gov/biblio/1808742},
  note = {Source identifier: 1808742}
}