@misc{indiciae86156e566ab6,
  title = {Extrinsic Absorption Pathways in Vanadium-Doped SiC Measured Using a Total Internal Reflection Geometry},
  author = {Kramer, Noah J. and Voss, Lars F. and Conway, Adam M. and Grivickas, Paulius V. and Bora, Mihail and Hall, David L. and Caruso, Anthony N.},
  year = {2020},
  doi = {10.1002/pssa.202000315},
  url = {https://www.osti.gov/biblio/1811227},
  note = {Source identifier: 1811227}
}