TY  - RPRT
TI  - Extrinsic Absorption Pathways in Vanadium-Doped SiC Measured Using a Total Internal Reflection Geometry
AU  - Kramer, Noah J.
AU  - Voss, Lars F.
AU  - Conway, Adam M.
AU  - Grivickas, Paulius V.
AU  - Bora, Mihail
AU  - Hall, David L.
AU  - Caruso, Anthony N.
PY  - 2020
DO  - 10.1002/pssa.202000315
UR  - https://www.osti.gov/biblio/1811227
ID  - 1811227
ER  -